IEEE

Analysis of Single-Event Leakage Current Degradation Induced by Heavy-Ion Irradiation in SiC MOSFETs

Abstract: The application of silicon carbide MOSFETs (SiC MOSFETs) in space is severely restricted by single-event burnout (SEB) and single-event leakage current (SELC) induced by heavy ions, yet the ...
IEEE

Multimodal Windows Malware Detection via Hybrid Analysis and Enriched Graphs: Effectiveness and Explainability

Abstract: The rapid spread of malware targeting the Windows operating system leads to an increasing and essential need to detect malicious Portable Executable (PE) files. Traditional approaches still ...