Abstract: To study the thickness uniformity of TiN in FinFETs, the electrical characteristics and reliability of n-FinFETs with ALD TiN and PVD TiN as barrier layer are investigated. Despite almost ...
Abstract: In this article, we propose a feature distillation-based uniformity few-shot domain adaptation (FUFD), for cross-domain fault diagnosis with sample shortage. To address the the few-shot ...
While all Macs are now powered by Apple's custom-designed chips, a new rumor claims that Apple may rekindle its partnership with Intel, albeit in a new and limited way. Apple supply chain analyst Ming ...
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