The tensile testing machine described here is a fully open-source device designed to determine the mechanical tensile strength of test specimens. At its core, it uses a single-board computer ...
Worst Case Heavy Ion Testing Conditions for Normally Off GaN-Based High Electron Mobility Transistor
Abstract: Single Event Effect of GaN HEMT devices is usually done using the same testing conditions as the one developed and validated a long time ago for MOSFETs components. This paper presents two ...
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