Abstract: A historical review of E-Model development for time-dependent dielectric breakdown (TDDB) is presented. The E-Model tends to be a very useful reliability assurance model for TDDB because of ...
The model was developed and internally validated on the NTUH-ECG data set and was externally validated on an independent FEMH-ECG data set. The model performance was evaluated using the F1-score, area ...
Abstract: The increasing complexity of modern technical systems, coupled with the growing demand for sustainability and safety, necessitates innovative approaches in system development. Model-Based ...