Esri Canada, a leader in geographic information system (GIS) solutions, today announced it has prequalified as a supplier of ...
Abstract: Recognition of wafer map defect patterns is essential for evaluating the reliability of micro-electronic manufacturing. Due to the difficulty of labeling, the available large-scale wafer ...
Abstract: Guided depth map super-resolution (GDSR) is one of the mainstream methods in depth map super-resolution, as high-resolution color images can guide the reconstruction of the depth maps and ...
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