Abstract: We present a new, pulsed-gate stress test approach to determine electrical parameter stability of SiC MOSFETs over a lifetime. We demonstrate that the results of our test procedure reflect ...
Discover which items should never be plugged into a power strip, along with other hazardous mistakes people frequently make.
Abstract: A novel extrinsic Fabry–Perot interferometric (EFPI) ultrasonic sensor is developed that can detect ultrasonic signals of partial discharge (PD) in high-voltage electrical equipment under ...