Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based ...
Abstract: Test set compaction is one of the key steps of the postproduction test known to bring down test pattern counts. This, in turn, allows one to reduce the corresponding test data volume, test ...
Abstract: With the biennial doubling of the number of transistors in a given area of silicon, contemporary integrated circuits (IC) are forging more and more often and will continue to forge complex ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback