Abstract: This work presents a 14-bit 100 MS/s Pipelined Successive-Approximation-Register (SAR) ADC in a 28nm CMOS process. The proposed calibration technique remedies the offset voltage and ...
Abstract: This letter presents an 8-bit 2.6-GS/s 8-way time-interleaved (TI) analog-to-digital converter (ADC) in 65-nm CMOS. The proposed dynamic current integrating sampler (DCIS) implements the ...
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