Abstract: Test set compaction is one of the key steps of the postproduction test known to bring down test pattern counts. This, in turn, allows one to reduce the corresponding test data volume, test ...
Abstract: With the biennial doubling of the number of transistors in a given area of silicon, contemporary integrated circuits (IC) are forging more and more often and will continue to forge complex ...
A classic communication theory, the double bind, may offer a unifying explanation for the paradoxes at the core of borderline ...
Worse, the most recent CERN implementation of the FPGA-Based Level-1 Trigger planned for the 2026-2036 decade is a 650 kW system containing an incredibly high number of transistor, 20 trillion in all, ...
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