Abstract: Test set compaction is one of the key steps of the postproduction test known to bring down test pattern counts. This, in turn, allows one to reduce the corresponding test data volume, test ...
Abstract: With the biennial doubling of the number of transistors in a given area of silicon, contemporary integrated circuits (IC) are forging more and more often and will continue to forge complex ...
Time to don your party hats, clink your glasses and learn some interesting facts while you wait to ring in 2026. There’s no ...
A classic communication theory, the double bind, may offer a unifying explanation for the paradoxes at the core of borderline ...
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