IEEE

Reliability Evaluation for the Exponential Load-Sharing System Based on System Accelerated Life Testing Data

Abstract: In this article, the reliability assessment methods for the exponential load-sharing system is proposed based on the system accelerated life testing data under the equal load-sharing rule.
IEEE

Analysis of the Single-Event Latch-Up Cross section of a 16 nm FinFET System-on-Chip Using Backside Single-Photon Absorption Laser Testing and Correlation With Heavy Ion Data

Abstract: The single-event latch-up (SEL) cross section of a 16 nm bulk finFET programmable system-on-chip (SoC) is investigated by combining single-photon absorption (SPA) laser testing, emission ...