What many engineers once saw as a flaw in organic electronics could actually make these devices more stable and reliable, ...
Intel has completed acceptance testing of the industry's first commercial high-NA EUV lithography system with a numerical ...
What many engineers once saw as a flaw in organic electronics could actually make these devices more stable and reliable, ...
What many engineers once saw as a flaw in organic electronics could actually make these devices more stable and reliable, according to new research ...
Abstract: The paper deals with the static bend testing of electrically conductive glued joints between SMD chip resistors and conductive pattern on flexible substrates. Two types of two-part epoxy ...
State Key Laboratory of Molecular Engineering of Polymers, Department of Macromolecular Science, Fudan University, Shanghai 200433, China Institute of Molecular Materials and Devices, Fudan University ...
Worst Case Heavy Ion Testing Conditions for Normally Off GaN-Based High Electron Mobility Transistor
Abstract: Single Event Effect of GaN HEMT devices is usually done using the same testing conditions as the one developed and validated a long time ago for MOSFETs components. This paper presents two ...
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