A microscope that cost less than £50 and took under 3 hours to build using a common 3D printer could be transformative for ...

New lensless imaging system uses sensor arrays and computation to deliver wide-field, sub-micron optical resolution.

UConn engineers develop new image sensor to achieve 3D microscopic resolution without lenses. (Envato stock image). Imaging ...

Researchers from Skoltech Engineering Center's Hierarchically Structured Materials Laboratory have developed a new method to ...

Researchers from the High Energy Nuclear Physics Laboratory at the RIKEN Pioneering Research Institute (PRI) in Japan and ...

Designed to inspect fresh-cut product straight from the field, this belt-fed system combines high-performance foreign ...

Polarized light is one of the most powerful tools scientists have for peering inside matter, yet the way it twists, scatters ...

In 2024, the global market size of Wafer Defect Inspection System was estimated to be worth USD 7661 Million and is forecast ...

Semiconductor Inspection Microscope Market Growth is driven by advanced node scaling, demand for defect-free wafers, rising 3D/complex packaging, and adoption of high-resolution optical & ...

Abstract: Scanning acoustic microscope (SAM) inspection is becoming an essential nondestructive procedure to defect delamination, voids, cracks in the plastic encapsulated devices. The C-scan SAM ...