IEEE

Attention-Guided Multitask Learning for Surface Defect Identification

Abstract: Surface defect identification is an essential task in the industrial quality control process, in which visual checks are conducted on a manufactured product to ensure that it meets quality ...

[Latest] Micro LED Mass Transfer Market Set to Reach US$ 4,498.3 Billion by 2035 | Astute Analytica

Celeprint push throughput boundaries. Manufacturers prioritize hybrid solutions to tackle yield issues, while automotive ...
IEEE

DMPDD-Net: An Effective Defect Detection Method for Aluminum Profiles Surface Defect

Abstract: Defect detection is an important part of the manufacturing process of industrial products. The processing of aluminum profiles requires more accurate and robust defect detection methods.
Interesting Engineering

At atomic scale, diamonds can briefly trap heat in unexpected ways, transform quantum tech

A new study could influence how scientists design diamond-based quantum technologies, including ultra-precise sensors and ...
C&EN

Improving Speed and Affordability without Compromising Accuracy: Standard Binding Free-Energy Calculations Using an Enhanced Sampling Algorithm, Multiple-Time Stepping, and ...

Laboratoire International Associé Centre National de la Recherche Scientifique et University of Illinois at Urbana−Champaign, Unité Mixte de Recherche n°7019, Université de Lorraine, B.P. 70239, 54506 ...