Abstract: We investigated the effects of positive and negative muons on 12-nm FinFET static random access memories (SRAMs) and 28-nm planar SRAMs and register files (RFs). For 12-nm devices, negative ...
Abstract: Load-pull simulations are crucial in RF and microwave engineering for assessing power amplifier performance. This paper presents advanced test benches for load-pull setups, leveraging ...
Department of Chemistry, University of Michigan, Ann Arbor, Michigan 48103, United States Life Sciences Institute, University of Michigan, Ann Arbor, Michigan 48109, United States Department of ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback