Abstract: Aging effect is one of the critical factors causing circuit reliability degradation due to negative bias temperature instability (NBTI) with continuous and intense logic operation. While ...
A new AI developed at Duke University can uncover simple, readable rules behind extremely complex systems. It studies how ...
Abstract: Designing devices with memristor arrays requires simultaneous simulations of a large number of memristors. The use of detailed physical models limits the size of memristor arrays during ...
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