The alpha300 Semiconductor Edition is a sophisticated confocal Raman microscope designed for the chemical analysis of semiconducting materials. This advanced tool helps researchers quickly analyze ...

During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...

(TNS) — An ultra-high vacuum scanning tunnel microscope — or UHV STM — has been donated to Miami University through an educational partnership agreement with the Materials and Manufacturing Division ...

The first step for semiconductor chips is visual inspection using an optical microscope or electrical measurements. 2 Mechanical probing, electron beams, emission microscopy, liquid crystal, etc., are ...

In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...

CRAIC Technologies, the global leader in UV-Visible-NIR microspectroscopy, today announced significant technology updates to the 508PV ™ Microscope Spectrophotometer, designed to meet the precision ...

PI's new objective focusing stage excels in fast nano-focusing applications, such as DNA sequencing, laser-technology, wafer metrology, super-resolution microscopy, medical technology, and slide ...

MICROSCOPE MAKERS constantly strive to improve images. Sometimes all it takes is a quick tweak to an existing instrument. Or it can mean decades of effort to develop a fundamentally different concept.

An ultra-high vacuum scanning tunnel microscope — or UHV STM — has been donated to Miami University through an educational partnership agreement with the Materials and Manufacturing Division of the ...