Reliability testing has long served as a method of ensuring that semiconductor devices maintain their desired performance over a given lifetime. As IC manufacturers continue to introduce new and ...

Decreased system reliability due to overloaded power supplies is a common engineering challenge. In this Q&A-style article submitted by Allied Electronic & Automation, David Norton, technical ...

When assessing system reliability using system, subsystem, and component-level data, assumptions are required about the form of the system structure in order to utilize the lower-level data. We ...

In today’s world, so-called “high-performance, sustainable” facilities are a dime a dozen. But many of these buildings rely on overly complex mechanical systems to carry out their mission. While these ...