Researchers from China University of Petroleum (East China), in collaboration with international partners, have reported a ...

Many IC designers finally have embraced design for testability (DFT) in the form of scan insertion for digital circuit designs because of the significant time-to-production advantages these techniques ...

Experts at the Table: Semiconductor Engineering sat down to discuss the rapidly changing landscape of design for testability (DFT), focusing on the impact of advancements in fault models, high-speed ...

Semiconductor companies are racing to develop AI-specific chips to meet the rapidly growing compute requirements for artificial intelligence (AI) systems. AI chips from companies like Graphcore and ...

In today’s fast growing Systems-on-Chip (SoC), incomplete or ineffective DFT support due to poor specification or loose design practices can quickly become the critical path to making market windows ...

Of all the electronic design automation (EDA) tools on the market, design for test (DFT) may be the most under-appreciated; even though building testability into a chip during the design phase will ...

For a list of DFT vendors and the types of tools they make, see the table at the bottom of this page. Design for test (DFT) firms are advancing on several fronts in an effort to ensure the testability ...